首页> 外文会议> >Review of various gamma radiation dosimeters based on thin and thick films of metal oxides and polymer materials
【24h】

Review of various gamma radiation dosimeters based on thin and thick films of metal oxides and polymer materials

机译:回顾基于金属氧化物和聚合物材料的薄膜和厚膜的各种伽马辐射剂量计

获取原文

摘要

This work reviews various thick and thin film radiation sensors made to date at University of Limerick. Numerous oxides such as NiO, LaFeO/sub 3/, CeO/sub 2/, TeO/sub 2/, In/sub 2/O/sub 3/, SiO/sub 2/, MnO etc. and their mixtures in different proportions were used. Polymers such as CuPc, NiPc, MnPc and CoPc were also studied in our laboratories. Thin and thick film devices were made in the form of resistor- and capacitor-type structures, structures with interdigitated electrodes, pn- junctions and transistors. The /sup 60/Co and /sup 137/Cs sources were used to expose the samples to radiation. Current-voltage characteristics, optical absorption spectra, Raman spectra, SEM, XRD measurements etc. for the samples were recorded after each exposure procedure and values of radiation damage were estimated. Mixing materials in different proportions was found to change the sensitivity of these devices. In general thin film devices were found to be more sensitive to lower doses of radiation than the counterpart the thick films. Properties of thick film devices were restored after annealing. This suggests that these films can be reused on repeatable basis. Thin film devices can hardly undergo heat treatment as diffusion of the materials occurs. It was experimentally demonstrated that it is possible to fabricate a device that would satisfy the requirement of particular application, such as the sensitivity to /spl gamma/-radiation exposure and working dose region. Based on the above given data, these structures are therefore might be regarded as a cost-effective alternative for room temperature real time /spl gamma/-radiation dosimetry.
机译:这项工作回顾了利默里克大学迄今制造的各种厚膜和薄膜辐射传感器。 NiO,LaFeO / sub 3 /,CeO / sub 2 /,TeO / sub 2 /,In / sub 2 / O / sub 3 /,SiO / sub 2 /,MnO等多种氧化物及其混合物的不同比例被使用。在我们的实验室中还研究了诸如CuPc,NiPc,MnPc和CoPc之类的聚合物。薄膜和厚膜器件以电阻器和电容器型结构,具有叉指状电极,pn结和晶体管的结构制成。 / sup 60 / Co和/ sup 137 / Cs源用于将样品暴露在辐射下。在每次曝光程序之后记录样品的电流-电压特性,光学吸收光谱,拉曼光谱,SEM,XRD测量等,并估计辐射损伤的值。发现以不同比例混合材料会改变这些设备的灵敏度。通常,发现薄膜器件比厚膜器件对更低剂量的辐射更敏感。退火后恢复了厚膜器件的性能。这表明这些胶片可以重复使用。随着材料的扩散,薄膜器件几乎不能进行热处理。实验证明,可以制造出满足特定应用要求的器件,例如对/ splγ/辐射暴露的敏感性和工作剂量区域。因此,基于以上给出的数据,这些结构可以被视为室温实时/ spl伽玛/辐射剂量法的一种经济高效的替代方案。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号