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Potential decay interpretation on insulating films: necessity of combining charge injection and slow volume polarization processes

机译:绝缘膜上的潜在衰减解释:结合电荷注入和缓慢的体积极化过程的必要性

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We suggest that any interpretation of potential decay on insulating materials, especially at low fields, but not only, should carefully examine the hypothesis of slow polarization processes, often overlooked in the past. To verify this hypothesis, we achieved surface potential measurements on thin films of polypropylene and high density polyethylene, involving fields up to 10/sup 8/ V.m/sup -1/. We present here the first results of this study, concerning isothermal potential decay and potential profiles.
机译:我们建议,对绝缘材料上的电位衰减进行任何解释,尤其是在低电场下,不仅如此,还应仔细研究缓慢极化过程的假设,该假设通常在过去被忽略。为了验证这一假设,我们在聚丙烯和高密度聚乙烯薄膜上实现了表面电势测量,涉及的电场最大为10 / sup 8 / V.m / sup -1 /。我们在这里介绍了这项研究的第一个结果,涉及等温电势衰减和电势曲线。

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