首页> 外文会议> >VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes
【24h】

VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes

机译:系统奇重列字节错误检测SEC-DED码的VLSI设计

获取原文

摘要

The paper introduces an extension to previous single error correcting (SEC)-double error detecting (DED)-single byte error detecting (SBD) codes. The proposed approach constructs systematic odd-weight-column SEC-DED-SBD codes whose corrigible errors also include any odd number of erroneous bits per byte. The main purpose of this paper is to show that the proposed codes are suitable for high performances VLSI implementations in computer applications, using high speed encoding/decoding circuits and parallel data manipulation. Furthermore, the paper shows how such codes can be easily designed from the specifications using a software tool, which generates the VHDL (VHSIC Hardware Description Language) description of the circuits.
机译:本文介绍了对先前的单错误纠正(SEC)-双错误检测(DED)-单字节错误检测(SBD)代码的扩展。提出的方法构造了系统的奇数列SEC-DED-SBD码,其可纠正错误还包括每字节任何奇数个错误位。本文的主要目的是表明所提出的代码适用于使用高速编码/解码电路和并行数据操作的高性能VLSI在计算机应用中的实现。此外,本文还介绍了如何使用软件工具根据规范轻松地设计此类代码,该软件工具会生成电路的VHDL(VHSIC硬件描述语言)描述。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号