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Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array

机译:具有自动检定技术的静态RAM发生器,用于0.5微米三金属嵌入式阵列

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This paper describes the design and development of module generators for metallized single-port and dual-port static RAMs (SPRAM and DPRAM) for a 0.5 micron embedded-array family. These generators offer an ASIC designer the ability to choose RAMs of user-defined size with some flexibility on the aspect ratio. An automatic generator characterisation (AGC) tool developed to efficiently characterize RAM generators is discussed.
机译:本文介绍了用于0.5微米嵌入式阵列系列的金属化单端口和双端口静态RAM(SPRAM和DPRAM)的模块生成器的设计和开发。这些生成器使ASIC设计人员能够选择用户定义大小的RAM,并且在纵横比上具有一定的灵活性。讨论了一种自动生成器表征(AGC)工具,该工具旨在有效地表征RAM生成器。

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