Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

摘要

A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model.