Measurement of microwave properties of X-band accelerating structure under pulsed high-power operation at liquid nitrogen temperature

摘要

After required chemical treatments a disk-loading structure was operated at liquid nitrogen temperature with X-band magnetron as an RF source. The peak RF pulse power was variable from 150 to 300 KW and the average power was altered by changing the pulse repetition rate between 1400 and 2800 pps. Measurements on this structure both at low and at high power indicated the Q factor of 6800 at room temperature,which increased to 17000. At liquid nitrogen temperature-an enhancement factor greater then 2,5 in good agreement with theory.