首页> 外文会议> >Single electron charging effect in coupled quantum dots of a Si-MOSFET
【24h】

Single electron charging effect in coupled quantum dots of a Si-MOSFET

机译:Si-MOSFET耦合量子点中的单电子充电效应

获取原文

摘要

Single electron transport was studied by using a designed mesoscopic structure in a Si-MOSFET with a dual-gate structure. Both the electron concentration and the potential barrier height in the narrow channel can be controlled by the field effect. The successive transformation of the quantum wire into coupled quantum dots was achieved in this device. The measured transport properties were consistent with the Coulomb blockade of the single electron tunneling.
机译:通过在双栅结构的Si-MOSFET中使用设计的介观结构来研究单电子传输。窄沟道中的电子浓度和势垒高度都可以通过场效应来控制。在该装置中实现了量子线到耦合量子点的连续转换。测得的传输性质与单电子隧穿的库仑封锁相一致。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号