On the analysis of a transition to a layered ridged dielectric waveguide

摘要

With the ultimate goal being the characterization of a transition to a dielectric waveguide, the authors present the three-dimensional integral equation mode matching technique, with emphasis on the extensions of the technique from 2-D to 3-D problems and from simple microstrip on ridges to more complicated multilayered structures. The analysis of some simple geometries is presented as evidence of the utility of the numerical technique. Preliminary results and future considerations which are necessary for the full characterization of a transition are discussed.