A superconducting circuit-based time-domain reflectometer with deconvolution has achieved a record 2.5-ps risetime at the device under test's (DUT's) interface. The corresponding spatial resolution approaches 0.1 mm for high dielectric media. Examples for applications are given. The tail effect caused by large discontinuities is eliminated by deconvolution. An innovative partial reflection calibration is suggested to improve the resolution for on-chip tests.
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