An accurate method for permittivity and loss tangent measurements of low loss dielectric using TE/sub 01 delta / dielectric resonators

摘要

Accurate methods of permittivity and loss tangent measurements of low loss dielectrics using TE/sub 01 delta / mode dielectric resonators are discussed. To reduce influence of conductor losses on the Q-factor of the resonant system the dielectric specimen is placed far from metal walls but conductor losses are taken into account by means of a rigorous methods of analysis. It is shown that using these methods accuracy of loss tangent measurements can be improved 2-3 times in comparison with the classical Courtney method.