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Circularly polarized luminescence from chiral thin films

机译:手性薄膜的圆偏振发光

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Photoluminescent nanostructured thin films have been fabricated using physical vapour deposition and the glancing angle deposition (GLAD) technique. Precision controlled substrate motion and oblique incidence (>75°) enable the fabrication of a variety of 3-D morphologies including vertical posts, helical (chiral) columns and chevrons. Scanning electron microscopy and X-ray diffraction were used to characterize the film nanostructure. These experiments focussed on the chiral morphology which exhibits intriguing polarization behaviour such as selective transmission of circularly polarized light and circularly polarized photoluminescence. Helical films of Y_2O_3:Eu and Alq_3 were fabricated with thicknesses in excess of 2 μm and densities nominally 60% of bulk. Transmission spectroscopic ellipsometry measurements were used to determine the degree of selective transmission of polarized light through the samples. The degree of circular polarization for the photoluminescent light emitted from helical films was measured with the use of a quarter waveplate and linear polarizer. Polarized photoluminescence efficiencies were consistent with the observed selective transmission of circularly polarized light through the films. The use of GLAD to control the nanoscale morphology of the films allows for the spectral location and strength of these polarization effects to be easily and accurately selected.
机译:已经使用物理气相沉积和掠射角沉积(GLAD)技术来制造光致发光纳米结构的薄膜。精确控制的基板运动和倾斜入射(> 75°)使得能够制造各种3D形态,包括垂直立柱,螺旋(手性)柱和V形。扫描电子显微镜和X射线衍射被用来表征薄膜的纳米结构。这些实验集中于表现出有趣的偏振行为的手性形态,例如圆偏振光的选择性透射和圆偏振光致发光。 Y_2O_3:Eu和Alq_3的螺旋膜的厚度超过2μm,密度名义上占体积的60%。透射光谱椭偏测量用于确定偏振光通过样品的选择性透射程度。使用四分之一波片和线性偏振器测量从螺旋膜发射的光致发光的圆偏振度。偏振光致发光效率与观察到的圆偏振光通过薄膜的选择性透射率一致。使用GLAD控制薄膜的纳米级形态,可以轻松,准确地选择这些偏振效应的光谱位置和强度。

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