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microPREP™ - A Novel Laser Tool for High-Volume Sample Preparation

机译:microPREP™-一种用于大批量样品制备的新型激光工具

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Over the past fifty year, lasers have perpetuated to find new, often groundbreaking applications in science and technology. The most important features of lasers are that photons are inherently free of elemental contamination, extremely high energy densities can be focused in very small areas and the laser beam can be precisely positioned using deflection mirrors. By reducing pulse lengths from a few nanoseconds down to the picosecond or femtosecond range, material's ablation is becoming increasingly "athermal", i.e. structure damage by local heating is reduced to well below a few microns, hi view of these outstanding characteristics of lasers as tools for micromachining, it is very surprising that sample preparation for microstructure diagnostics so far hasn't made use of laser technology. microPREP™, the all-new, patented laser-micromachining tool developed by 3D-Micromac is the first instrument to make fast, clean, and efficient laser ablation available for the preparation of samples for microstructure diagnostics. Exemplified for a sample to be investigated by transmission electron microscopy (TEM) and following a three-stage approach, a supporting basic structure is cut from the feedstock first. Second, the supported structure is thinned down to a few micron of residual thickness and third, the supported and thinned structure is polished using an ion broad beam. Illustrated by numerous examples, it is shown that this technology is ready to be applied on different areas of microstructure diagnostics and has very high potential for failure diagnostics.
机译:在过去的五十年中,激光技术一直在寻找新的,突破性的科学技术应用。激光的最重要特征是光子固有地不受元素污染,极高的能量密度可以聚焦在很小的区域,并且可以使用偏转镜精确定位激光束。通过将脉冲长度从几纳秒减小到皮秒或飞秒范围,材料的烧蚀变得越来越“无热”,即,由于激光器作为工具的这些杰出特性,局部加热对结构的损害减少到了几微米以下。对于微加工,迄今为止,用于微结构诊断的样品制备还没有利用激光技术是非常令人惊讶的。 microPREP™是3D-Micromac开发的获得专利的全新激光微加工工具,它是第一款可提供快速,清洁和高效的激光烧蚀技术来制备用于微结构诊断的样品的仪器。举例说明了要通过透射电子显微镜(TEM)研究的样品,并采用了三阶段方法,首先从原料上切下了支撑的基本结构。第二,将支撑结构减薄至剩余厚度为几微米,第三,使用离子宽束对支撑和减薄的结构进行抛光。通过大量示例说明,表明该技术已准备好应用于微结构诊断的不同领域,并且在故障诊断方面具有很高的潜力。

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