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Influence of Fast Neutron Irradiation on Critical Current Densities of Bi-2223/Ag Tape

机译:快速中子辐照对Bi-2223 / Ag带临界电流密度的影响

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Experimental results on the magnetic field behavior of the critical current in silver sheathed Bi-2223 tapes are presented. The experiments consist of transport and magnetic measurements in a wide temperature range and in external magnetic field up to 6 T. Significant enhancement of the intragrain critical current densities J_c are observed after irradiation with fast neutron. This is attributed to an improvement of flux pinning capability by the neutron induced defects, but the weak link structure is somewhat damaged as evidenced by the small degradation of transport critical current at low field. According to the measurement of remanent magnetic moment before and after irradiation with fast neutron, the connectivity in Bi-2223 tapes is reduced by 50% after irradiated to a fiuence of 2 x 10~(21) m~(-2), which resulted in the critical currents degradated by a factor of 10%.
机译:给出了在银包覆的Bi-2223胶带中临界电流的磁场行为的实验结果。实验包括在较宽的温度范围和高达6 T的外部磁场中的传输和磁测量。在用快中子辐照后,观察到晶粒内临界电流密度J_c显着提高。这归因于中子诱发的缺陷改善了磁通钉扎能力,但是弱连接结构受到了一定程度的损坏,这在低电场下传输临界电流的细微下降得到了证明。根据快中子辐照前后的剩余磁矩的测量,辐照至2 x 10〜(21)m〜(-2)的强度后,Bi-2223磁带中的连接性降低了50%,这导致临界电流降低了10%。

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