Depth-sensitive structural study of silicalite-1 films with grazing incidence X-ray diffraction

摘要

The change of crystal orientation within different MFI zeolite film structures wasfollowed with the depth-sensitive grazing incidence diffraction technique. The measurementsof the adsorbed and grown zeolite films at different incident and exit angles reflect thedistribution of the crystal orientation along the film thickness. With increasing zeolite filmthickness most of the crystals change their b-axes orientation from parallel to perpendicularto the samples’ surface.