Division of Materials Technology, School of Energy, Environment and Materials, King Mongkut's University of Technology Thonburi, Bangkok, Thailand;
Division of Materials Technology, School of Energy, Environment and Materials, King Mongkut's University of Technology Thonburi, Bangkok, Thailand;
Department of Physics, Faculty of Science, King Mongkut's University of Technology Thonburi, Bangkok, Thailand;
titanium oxide; reactive magnetron sputtering; optical constants; optical thin film; envelope method;
机译:包络法测定微晶硅薄膜的厚度和光学常数
机译:包络法测定微晶硅薄膜的厚度和光学常数
机译:测定基材上薄膜的光学常数和厚度-包络法的替代方法
机译:包络法测定氧化钛膜钛的光学常数和厚度
机译:确定各向异性聚合物薄膜光学常数的新方法:棱镜波导耦合的新应用。
机译:基于先进优化包络法
机译:通过反射率,透射率和膜厚测量来确定蒸发金属膜的近红外中的光学常数