首页> 外文会议>International Symposium for Testing and Failure Analysis(ISTFA 2004); 20041114-18; Worcester(Boston),MA(US) >Advanced Analytical Chemistry Techniques Enable Rapid, Cheap and Concise Electronic Failure Analysis
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Advanced Analytical Chemistry Techniques Enable Rapid, Cheap and Concise Electronic Failure Analysis

机译:先进的分析化学技术可实现快速,廉价和简洁的电子故障分析

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摘要

As the world of electronics grows ever smaller and more complex, chemists and physicists are finding a niche in the world of electronic failure analysis. Techniques normally used for drug screening, polymer design and chemical bonding studies are now being used to analyze system wide failures in computers and other microelectronic devices. The benefits of these techniques include low expense, rapid turn around time and definitive answers. As we move into the world of nanotechnology, these techniques will become key in analyzing failures that cannot be visualized using traditional FA methods.
机译:随着电子世界变得越来越小,越来越复杂,化学家和物理学家正在电子故障分析领域中找到一席之地。现在,通常将用于药物筛选,聚合物设计和化学键研究的技术用于分析计算机和其他微电子设备中的系统范围的故障。这些技术的优点包括费用低,周转时间短和确定的答案。随着我们进入纳米技术世界,这些技术将成为分析传统FA方法无法可视化的故障的关键。

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