首页> 外文会议>International Symposium on Process Systems Engineering 2003 pt.B; 2003 >Real-Time Estimation of Growth Rate and Surface Roughness in Thin Film Growth Using Kinetic Monte-Carlo Models
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Real-Time Estimation of Growth Rate and Surface Roughness in Thin Film Growth Using Kinetic Monte-Carlo Models

机译:动力学蒙特卡洛模型实时估算薄膜生长中的生长速率和表面粗糙度

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In this work, we present an approach for real-time estimation of surface roughness and growth rate in thin film growth using kinetic Monte-Carlo (MC) models. We use a multiscale model to describe the dynamics of gas phase and the evolution of film micro-structure of a thin film growth process in a stagnation flow geometry. A roughness and growth rate estimator is constructed that allows computing estimates of the surface roughness and growth rate at a time-scale comparable to the real-time evolution of the process. The estimator involves a kinetic MC simulator using multiple reduced-order lattice models, adaptive filters used to reduce stochastic fluctuations of the reduced-order lattice MC simulator outputs and measurement error compensators used to reduce the errors between the estimates and the measurements. The proposed estimator can be used within a real-time feedback control system to improve the control performance by providing estimates of surface roughness and growth rate at time instants in which the measurements of these variables are not available.
机译:在这项工作中,我们提出了一种使用动力学蒙特卡洛(MC)模型实时估计薄膜生长中的表面粗糙度和生长速率的方法。我们使用多尺度模型来描述气相动力学和停滞流几何中薄膜生长过程的薄膜微结构的演变。构造了粗糙度和生长速率估算器,该估算器允许在与过程的实时演变相当的时间尺度上计算表面粗糙度和生长速率的估算值。估计器包括使用多个降阶晶格模型的动力学MC仿真器,用于减少降阶晶格MC仿真器输出的随机波动的自适应滤波器以及用于减少估计和测量之间的误差的测量误差补偿器。可以在实时反馈控制系统中使用提出的估算器,以通过在这些变量的测量值不可用的时刻提供表面粗糙度和增长率的估算来改善控制性能。

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