首页> 外文会议>International Symposium on Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers; 20050627-0701; Paris(FR) >A Thin Passivating Tin(Ⅳ) Oxide Layer on Tin(Ⅱ)-Containing Fluoride Particles, or not? The M_(1-x)Sn_xF_2 Solid Solutions
【24h】

A Thin Passivating Tin(Ⅳ) Oxide Layer on Tin(Ⅱ)-Containing Fluoride Particles, or not? The M_(1-x)Sn_xF_2 Solid Solutions

机译:是否在含锡(Ⅱ)的氟化物颗粒上形成一层钝化的氧化锡(Ⅳ)薄层? M_(1-x)Sn_xF_2固体溶液

获取原文
获取原文并翻译 | 示例

摘要

Tin-119 Mossbauer spectroscopy shows that all powdered tin(Ⅱ) compounds give a small tin(Ⅳ) signal that has been attributed to the presence of a very thin layer of SnO_2 on the surface of the particles, that passivates against further oxidation, and is undetectable by X-ray diffraction. In a new development of this work, efficient passivation against further oxidation of the M_(1-x)Sn_xF_2 (M = Ca and Pb) solid solution poor in tin was found to be as high as for phases rich in tin, even though the amount of tin is way too low to be able to produce full coating of the particles by a thin layer of SnO_2. This observation required developing a new model to explain the sluggish oxidation of phases poor in tin, based on bonding type and strength.
机译:锡119 Mossbauer光谱显示,所有粉末状的锡(Ⅱ)化合物均产生小的锡(Ⅳ)信号,这归因于颗粒表面上存在非常薄的SnO_2层,该钝化层可防止进一步氧化,并且用X射线衍射无法检测到。在这项工作的新进展中,发现对锡含量低的M_(1-x)Sn_xF_2(M = Ca和Pb)固溶体进行进一步氧化的有效钝化与富锡相一样高,即使锡的量太低,以至于无法通过SnO_2薄层完全覆盖颗粒。此观察结果需要开发一种新的模型,以根据键合类型和强度来解释贫锡相的缓慢氧化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号