ORIGIN OF INCLUSION OF FOREIGN ELEMENTS DURING THE ELECTRODEPOSITION OF SOFT MAGNETIC NiFe, CoNiFe AND CoNiFeO ALLOYS: SIMS AND XPS ANALYSIS

摘要

SIMS analysis of soft magnetic NiFe, CoNiFe, and CoNiFeO alloys was used to quantify the presence of the following foreign elements: O, H, C, N, S, Cl, and B. XPS analysis was used to obtain chemical state information. The amount of foreign elements in the alloys was found to be dependent on the concentration of electrolytes in the plating bath and organic additives present. Calculation of equilibrium species present in the CoNiFe plating bath in pH range 2-6 shows the presence of possible electroactive species as noncomplexed (M~(+2)) and complexed (ML~+) metals. The mechanism for the origin of foreign elements in the bulk of magnetic alloys is discussed.