首页> 外文会议>International Conference on Solid-State and Integrated Circuit Technology(ICSICT-2006); 20061023-26; Shanghai(CN) >Noise Modeling Based on Self-Consistent Surface-Potential Description for Advanced MOSFETs aiming at RF Applications
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Noise Modeling Based on Self-Consistent Surface-Potential Description for Advanced MOSFETs aiming at RF Applications

机译:针对射频应用的高级MOSFET基于自洽表面势能描述的噪声建模

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摘要

We have developed MOSFETs noise models for the 1/f, thermal and induced-gate noise based on self-consistent surface-potential description. Consideration of non-uniform mobility and carrier distributions arising from the surface potential distribution along the channel is indispensable for accurate noise modeling for RF applications. The developed noise models are implemented in the complete surface-potential based MOSFET model HiSIM (Hiroshima-university STARC IGFET Model) for circuit simulations.
机译:我们已经基于自洽的表面电势描述针对1 / f,热和感应栅极噪声开发了MOSFET噪声模型。对于沿RF应用的精确噪声建模,必须考虑由沿通道的表面电势分布引起的非均匀迁移率和载流子分布。在完整的基于表面电位的MOSFET模型HiSIM(广岛大学STARC IGFET模型)中实现了开发的噪声模型,用于电路仿真。

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