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Modeling of FlowFET Characteristics

机译:FlowFET特性建模

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摘要

Classical electrokinetic theory demonstrates that modulation of the ζ-potential at the shear plane can alter both the magnitude and direction of Electroosmotic Flow (EOF) induced in a microchannel at low driving field strengths. In the FlowFET, ζ-potential is modulated by applying a voltage V_G - with respect to the driving field cathode -through the insulated side walls of the device. An analytical model based on overall charge neutrality is. presented which predicts the ζ-potential as a function of V_G. This is compared to values of shear plane ζ-potential extracted from EOF rate measurement data in a FlowFET. It is found that the model data and experimentally derived values for ζ-potential are within the same order of magnitude with good agreement between modeled and experimentally observed trends. Discrepancies are due to uncertainties related to experimental observation and lack of Stern layer modeling.
机译:经典的电动理论表明,在剪切平面上对ζ电位的调制可以改变在低驱动场强下在微通道中引起的电渗流(EOF)的大小和方向。在FlowFET中,通过相对于驱动场阴极通过设备的绝缘侧壁施加电压V_G来调制ζ电位。一个基于总体电荷中性的分析模型。提出了预测ζ电位随V_G的函数。将其与从FlowFET中从EOF速率测量数据提取的剪切平面ζ电位值进行比较。发现ζ势的模型数据和实验得出的值都在同一数量级内,在建模趋势和实验观测趋势之间有很好的一致性。差异是由于与实验观察有关的不确定性和缺乏斯特恩层建模的缘故。

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