首页> 外文会议>International Test Conference >Virtual Memory Structures Facilitating Memory BIST Insertion In Complex SoCs
【24h】

Virtual Memory Structures Facilitating Memory BIST Insertion In Complex SoCs

机译:虚拟内存结构有助于在复杂SoC中插入内存BIST

获取原文

摘要

In the emerging era of large scale SoCs comprised from complex IPs, typically designed for AI and Automotive applications, it is essential to embrace an innovative approach to overcome DFT challenges. One of these challenges is to provide a fast time to market solution. This solution must be generic, scalable, robust and Functional Safety (FuSa) aware. To accomplish this challenge, a generic Virtual Memory Wrapper (VMW) and a Virtual Memory Container (VMC) are introduced. These structures provide highly parametrized and scalable design, accompanied by a push-button memory BIST insertion flow. This innovative approach allows full decoupling between Functional & Test design aspects of a complex SoC.
机译:在新兴的由复杂IP组成的大规模SoC的新兴时代(通常为AI和汽车应用设计),必须采用创新方法来克服DFT挑战。这些挑战之一是提供快速上市的解决方案。该解决方案必须具有通用性,可伸缩性,鲁棒性和功能安全性(FuSa)意识。为了解决这一挑战,引入了通用的虚拟内存包装器(VMW)和虚拟内存容器(VMC)。这些结构提供了高度参数化和可扩展的设计,并带有按钮式存储器BIST插入流程。这种创新的方法可以使复杂SoC的功能和测试设计方面完全脱钩。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号