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Amorphous Silicon Thin-film Transistor Arrays Fabricated by Jet Printing

机译:喷射印刷非晶硅薄膜晶体管阵列

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Digitally processed, jet-printed etch masks were used to fabricate hydrogenated amorphous silicon thin-film transistor (TFT) matrix-addressing arrays. In place of conventional lithography, wax-based etch masks with a minimum feature size of ~ 40 μm were used to pattern device structures using a multi-ejector piezoelectric printhead. Bottom-gate TFTs with source-drain contacts overlapping the channel were created using a four-mask process. TFTs in a 64x64 pixel array of 300 μm square pixels had Ⅰ-Ⅴ characteristics comparable to photolithographically patterned devices. The average carrier mobility was 0.7 cm~2/V·s for device having a W/L of ~ 0.5. A threshold voltage of ~ 5 V and on/off ratios exceeding 10~8 were measured for a typical device in the array.
机译:经过数字处理的喷印蚀刻掩模用于制造氢化非晶硅薄膜晶体管(TFT)矩阵寻址阵列。代替传统的光刻技术,使用最小特征尺寸约为40μm的蜡基蚀刻掩模,使用多喷射器压电打印头对器件结构进行图案化。使用四掩膜工艺创建了具有与沟道重叠的源极-漏极触点的底栅TFT。 300μm正方形像素的64x64像素阵列中的TFT具有与光刻图案化设备相当的Ⅰ-Ⅴ特性。 W / L约为0.5的器件的平均载流子迁移率为0.7 cm〜2 / V·s。对于阵列中的典型器件,测得的阈值电压约为5 V,开/关比超过10〜8。

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