首页> 外文会议>International Display Manufacturing Conference FPD Expo(IDMC'03) >An Improvement of the Cut-off Potential Ratio by Enhance the Flatness of the G1 Grid in Color Electron Gun Manufacturing
【24h】

An Improvement of the Cut-off Potential Ratio by Enhance the Flatness of the G1 Grid in Color Electron Gun Manufacturing

机译:通过提高彩色电子枪制造中的G1栅格的平坦度来提高截止电位比

获取原文

摘要

One of the most important grids in the color electron gun is the G1 grid for its high sensitive characteristics in the cut-off voltage. For obtaining a better control in the cut-off potential ratio, a novel method was developed by controlling its concave and convex distribution to enhance the flatness on the G1 coin after the stamping process. It could be reached that the flatness level is less than 4 μm for a single aperture. This have help the cathode insertion and the cut-off potential ratio also has improved.
机译:彩色电子枪中最重要的栅极之一是G1栅极,因为它具有截止电压的高灵敏度特性。为了更好地控制截止电位比,开发了一种新颖的方法,通过控制其凹凸分布来提高冲压后G1硬币的平整度。对于单个孔,可以达到平坦度小于4μm。这有助于阴极插入并且截止电位比也得到了改善。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号