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A review on the testing method for low residual voltages in SPD

机译:SPD中低残留电压的测试方法综述

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Technical issues on measuring the low residual voltage (Vres) in SPD determined in international standards are reviewed. The SPD for power supplies represents residual voltages more than 1.5kV but the SPD for applications in low voltage data, communications and signaling circuits shows several tens ~ hundreds volts. Thus, it is necessary to determine detailed technical specifications in a technical standard for implementing its accurate measurements. However, there are no such detailed specifications in international standards and that may cause confusions in operating a certification system based on the international standard for SPD performance. Therefore, in this study, technical issues on international standards for measuring the low residual voltages of SPD are reviewed.
机译:审查了有关测量国际标准中确定的SPD中的低残留电压(Vres)的技术问题。电源的SPD表示残留电压超过1.5kV,但用于低压数据,通信和信号电路的SPD则显示数十至数百伏。因此,有必要确定技术标准中的详细技术规格以实现其精确测量。但是,国际标准中没有这样的详细规范,并且可能会导致基于SPD性能国际标准的认证系统的操作混乱。因此,在这项研究中,对用于测量SPD的低残留电压的国际标准的技术问题进行了回顾。

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