Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology,Science Town, Daejeon, South Korea;
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology,Science Town, Daejeon, South Korea;
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology,Science Town, Daejeon, South Korea;
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology,Science Town, Daejeon, South Korea;
thin-film metrology; thickness measurement; multi-wavelength reflectometry; angle-resolved reflectometry;
机译:使用互补开口环谐振器测量多层介电结构的厚度和介电常数
机译:涡流测试中多层结构厚度测量的建模与反演技术
机译:使用角度分辨光发射光谱法直接测量MoS_2的厚度依赖性电子能带结构
机译:用于厚度测量的角度分辨反射计的厚度薄膜结构
机译:用于厚度测量和监视多层结构的声学方法。
机译:受谐振器启发的超材料传感器:测量多层结构厚度的设计和实验验证
机译:使用发达的薄膜厚度标准测量Beruforge 152DL薄膜润滑剂
机译:用阻抗特征监测平面多层弹性结构的厚度偏差