首页> 外文会议>Interfacial Phenomena in Fine Particle Technology >MEASUREMENTS OF COLLOIDAL FORCES BETWEEN AN AFM PROBE AND NANOPARTICLES DEPOSITED ON A SUBSTRATE
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MEASUREMENTS OF COLLOIDAL FORCES BETWEEN AN AFM PROBE AND NANOPARTICLES DEPOSITED ON A SUBSTRATE

机译:AFM探针与沉积在基质上的纳米微粒之间的胶体力的测量

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摘要

We report structural forces measured for 10 nm silica particles deposited on alumina substrate and 5-80 nm alumina particles on mica using atomic force microscopy technique. For nanoparticles forming clusters, oscillation of structural forces was recorded with a periodicity that is close to the size of the nanoparticles used. Additionally, selected force-separation results indicate that the forces involved between the AFM probe and individual nanoparticles can be studied using the nanoparticle-coated substrates.
机译:我们报告使用原子力显微镜技术对沉积在氧化铝基材上的10 nm二氧化硅颗粒和在云母上的5-80 nm氧化铝颗粒测量的结构力。对于形成团簇的纳米颗粒,以接近所用纳米颗粒尺寸的周期性记录结构力的振荡。此外,选定的力分离结果表明,可以使用纳米颗粒涂覆的基材研究AFM探针与单个纳米颗粒之间涉及的力。

著录项

  • 来源
  • 会议地点 Montreal(CA);Montreal(CA);Montreal(CA);Montreal(CA)
  • 作者

    J. Drelich; Z. Xu; J. Masliyah;

  • 作者单位

    Department of Materials Science and Engineering Michigan Technological University Houghton, MI 49931, U.S.A.;

    Department of Chemical and Materials Engineering University of Alberta Edmonton, Canada T6G 2G6;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 湿法冶炼;
  • 关键词

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