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Determining the Uncertainty in Lithium Ion Battery Micro-Structural Parameters Extracted from Tomographic Data

机译:确定从层析成像数据中提取的锂离子电池微结构参数的不确定性

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摘要

Over the past few years X-ray tomographic microscopy (XTM) has advanced to an indispensable tool to characterize and quantify lithium ion battery (LIB) electrodes in terms of mi-crostructural parameters. Its non-invasiveness, as well as its 3D character render the technique not only suitable for ex-situ sample analysis, but also capable to perform in-situ and operando studies. However, in particular tomographic data of graphite negative electrodes typically suffers from low contrast between the pore space and the active material, due to the weakly X-ray attenuating nature of carbon based materials. As a result data binarization is error-prone, which directly translates into large uncertainties of the calculated microstructural parameters. This study systematically investigates the mentioned error propagation from the binariza-tion to the set of microstructural characteristics porosity, tortuosity and specific surface area on XTM datasets of seven commercial LIB negative electrodes. To allow for a controlled variation of the binarization procedure, we parametrize it with two parameters that are varied in meaningful uncertainty ranges: (i) a threshold, which mostly controls the foreground to background ratio and (ii) a morphological filtering parameter that controls the smoothness of the binarization. We find that the computed microstructural characteristics are very prone to binarization er-rors in particular for low porosity electrodes, where nonlinear error propagation leads to uncertainties in the tortuosity exceeding 100 %. Finally, while the presented analysis is computationally expensive, we propose a criterion that allows to estimate the expected uncertainties for the different microstructural parameters based on a simple histogram analysis. This analysis can easily be conducted for example dur-ing test experiments at an X-ray tomographic imaging beamline to optimize the imaging pa-rameters for subsequent data analysis.
机译:在过去的几年中,X射线断层扫描显微镜(XTM)已发展成为必不可少的工具,可以根据微观结构参数表征和定量锂离子电池(LIB)电极。它的无创性及其3D角色使该技术不仅适用于异地样品分析,而且还能够进行原位和操作研究。然而,由于碳基材料的弱X射线衰减特性,特别是石墨负极的断层扫描数据通常在孔空间和活性材料之间具有低对比度。结果,数据二值化是容易出错的,这直接转化为所计算的微结构参数的较大不确定性。这项研究系统地研究了上述误差从二值化到七个商用LIB负极XTM数据集上的微观结构特征孔隙率,曲折度和比表面积的传播。为了允许二值化过程的受控变化,我们使用两个在有意义的不确定性范围内变化的参数对其进行参数化:(i)一个阈值,该阈值主要控制前景与背景之比;(ii)形态学滤波参数,控制二值化的平滑度。我们发现,特别是对于低孔隙率电极,所计算的微观结构特征很容易产生二值化错误,其中非线性误差传播导致曲折度的不确定性超过100%。最后,尽管提出的分析计算量很大,但我们提出了一个标准,该标准允许基于简单的直方图分析来估计不同微结构参数的预期不确定性。这种分析可以很容易地进行,例如在X射线断层扫描成像束线的测试过程中进行,以优化成像参数,以进行后续数据分析。

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  • 来源
  • 会议地点 Mainz(DE)
  • 作者单位

    ETH Zurich, Laboratory for Nanoelectronics, Department of Information Technology and Electrical Engineering, Zurich, CH-8092 Switzerland;

    ETH Zurich, Laboratory for Nanoelectronics, Department of Information Technology and Electrical Engineering, Zurich, CH-8092 Switzerland;

    Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland;

    Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland,Institute for Biomedical Engineering of the University and ETH Zurich, Zurich, Switzerland;

    ETH Zurich, Laboratory for Nanoelectronics, Department of Information Technology and Electrical Engineering, Zurich, CH-8092 Switzerland;

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