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High operation temperature mid-wavelength interband cascade infrared photodetectors grown on InAs substrate

机译:在InAs衬底上生长的高工作温度中波长带间级联红外光电探测器

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摘要

In recent years, interband cascade detectors (ICIP) based on typer-Ⅱ superlattice have shown great performance potential at high operation temperature. In this paper, we report our studies on mid-infrared interband cascade photodetectors first grown on InAs substrate. We examined the photo-generated carriers' transport in ICIP structures by comparing three detectors grown on InAs substrate. The 2-stages ICIP device has demonstrated a high quantum efficiency around 20% at room temperature. The dark current density of the 2-stages ICIP device at -0.05V is as low as 1 nA at 80K, 1 mA at 150K, which is comparable to the state of art PIN superlatticephotodetectorswith similar cutoff wavelength. The Johnson-noise limited D* reaches 1.64×10~(14)cm.Hz~(1/2)/W at 3.65 μm and 80K, and 4.1×10~(10)cm.Hz~(1/2)/W at 3.8 μm and 200K. The 300 K background limited infrared performance (BLIP) operation temperature is estimated to be over 140 K.
机译:近年来,基于typer-Ⅱ超晶格的带间级联检测器(ICIP)在高工作温度下显示出巨大的性能潜力。在本文中,我们报告了我们首先在InAs衬底上生长的中红外带间级联光电探测器的研究成果。通过比较在InAs衬底上生长的三个探测器,我们检查了光生载流子在ICIP结构中的传输。两级ICIP器件在室温下显示出约20%的高量子效率。两级ICIP器件在-0.05V时的暗电流密度在80K时低至1 nA,在150K时低至1 mA,这可与具有相似截止波长的PIN超晶格光电检测器相媲美。约翰逊噪声限制D *在3.65μm和80K时达到1.64×10〜(14)cm.Hz〜(1/2)/ W,在4.1×10〜(10)cm.Hz〜(1/2)/时达到W在3.8μm和200K下。 300 K背景限制红外性能(BLIP)操作温度估计超过140K。

著录项

  • 来源
    《Infrared Technology and Applications XLII》|2016年|98191J.1-98191J.6|共6页
  • 会议地点 Baltimore MD(US)
  • 作者单位

    Key Laboratory of Infrared Imaging Material and Detectors Shanghai Institute of Technical Physics, Chinese Academy of Sciences Shanghai 200083, China;

    Key Laboratory of Infrared Imaging Material and Detectors Shanghai Institute of Technical Physics, Chinese Academy of Sciences Shanghai 200083, China;

    Key Laboratory of Infrared Imaging Material and Detectors Shanghai Institute of Technical Physics, Chinese Academy of Sciences Shanghai 200083, China;

    Key Laboratory of Infrared Imaging Material and Detectors Shanghai Institute of Technical Physics, Chinese Academy of Sciences Shanghai 200083, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ICIP; InAs/GaSb; superlattice;

    机译:ICIP; InAs / GaSb;超晶格;
  • 入库时间 2022-08-26 13:47:47

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