A Method of Improving Precision in Software Testing Based on Defect Patterns

机译：一种基于缺陷模式的软件测试精度提高方法

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摘要

This paper presents a method, control-flow interval iteration in presence of interprocedural side-effect analysis, to improve test precision in software testing based on defect patterns, then an exact interval computation can be used in defect test algorithm of DTS. Our experiment shows that the DTS, using this method, can reduce the false positive rate and drop defect rate effectively.

机译：本文提出了一种基于过程间副作用分析的控制流区间迭代方法，以提高基于缺陷模式的软件测试的测试精度，然后在DTS的缺陷测试算法中采用精确的区间计算方法。我们的实验表明，使用这种方法的DTS可以有效地降低误报率并降低缺陷率。

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来源
《Industrial and Information Systems, 2009. IIS '09》|2009年|285-288|共4页
会议地点 Haikou(CN);Haikou(CN)
作者
Jin Dahai; Gong Yunzhan; Xiao Qing; Wang Yawen; Yang Zhaohong;
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State Key Lab. of Networking Switching Technol., Beijing Univ. of Posts Telecommun., Beijing;

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program testing; systems analysis; control-flow interval iteration; defect patterns; drop defect rate; false positive rate; interprocedural side-effect analysis; software testing; control flow interval iteration;

机译：程序测试;系统分析;控制流区间迭代;缺陷模式;跌落缺陷率;误报率;过程间副作用分析;软件测试;控制流区间迭代;

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A Method of Improving Precision in Software Testing Based on Defect Patterns

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