Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry

摘要

Abstract: nic speckle pattern interferometry is elaboratedin such a way that also spatially resolved imagedecorrelation can be measured. While retaining thetypical ESPI setup for deformation measurements, aspeckle correlation formalism is implemented based onthe phase-shift method. In many practical situationsdecorrelation is directly related to surfacemicrostructure changes of a test specimen. Feasibilityand restrictions of the method are illustrated bymeasurements of water-induced changes at the surfacesof natural stones and by monitoring microbiologicalactivity on stones.!6