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On the Analysis of Wavelet-Based Approaches for Print Grain Artifacts

机译:基于小波的打印纹理伪像方法分析

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Grain is one of several attributes described in ISO/IEC TS 24790, a technical specification for the measurement of image quality for monochrome printed output. It defines grain as aperiodic fluctuations of lightness greater than 0.4 cycles per millimeter, a definition inherited from the latest official standard on printed image quality, ISO/IEC 13660. Since this definition places no bounds on the upper frequency range, higher-frequency fluctuations (such as those from the printer's halftone pattern) could contribute significantly to the measurement of grain artifacts. In a previous publication, we introduced a modification to the ISO/IEC 13660 grain measurement algorithm that includes a band-pass, wavelet-based, filtering step to limit the contribution of high-frequency fluctuations. This modification improves the algorithm's correlation with the subjective evaluation of experts who rated the severity of printed grain artifacts. Seeking to improve upon the grain algorithm in ISO/IEC 13660, the ISO/IEC TS 24790 committee evaluated several graininess metrics. This led to the selection of the above wavelet-based approach as the top candidate algorithm for inclusion in a future ISO/IEC standard. Our recent experimental results showed r2 correlation of 0.9278 between the wavelet-based approach and the subjective evaluation conducted by the ISO committee members based upon 26 samples covering a variety of printed grain artifacts. On the other hand, our experiments on the same data set showed much lower correlation (r2 = 0.3555) between the ISO/IEC 13660 approach and the same subjective evaluation of the ISO committee members. In addition, we introduce an alternative approach for measuring grain defects based on spatial frequency analysis of wavelet-filtered images. Our goal is to establish a link between the spatial-based grain (ISO/IEC TS 24790) approach and its equivalent frequency-based one in light of Parseval's theorem. Our experimental results showed r2 correlation near 0.99 between the spatial and frequency-based approaches.
机译:颗粒感是ISO / IEC TS 24790(一种用于单色打印输出的图像质量测量的技术规范)中描述的几种属性之一。它将晶粒定义为大于0.4周期/毫米的非周期性周期性波动,该定义继承自有关打印图像质量的最新官方标准ISO / IEC13660。由于该定义对较高频率范围没有限制,因此较高频率波动( (例如打印机的半色调图案中的那些)可能会大大影响颗粒伪影的测量。在以前的出版物中,我们对ISO / IEC 13660谷物测量算法进行了修改,其中包括基于带通,基于小波的滤波步骤,以限制高频波动的影响。这种修改提高了算法与评估打印谷物伪影严重性的专家的主观评估的相关性。为了改进ISO / IEC 13660中的颗粒算法,ISO / IEC TS 24790委员会评估了几种颗粒度指标。因此,选择了上述基于小波的方法作为将来纳入ISO / IEC标准的最佳候选算法。我们最近的实验结果表明,基于小波的方法与ISO委员会成员基于26个样本进行的主观评估之间的r2相关性为0.9278,该样本涵盖了各种印刷的谷物假象。另一方面,我们在相同数据集上进行的实验表明,ISO / IEC 13660方法与ISO委员会成员的相同主观评估之间的相关性低得多(r2 = 0.3555)。另外,我们介绍了一种基于小波滤波图像的空间频率分析来测量晶粒缺陷的替代方法。我们的目标是根据Parseval定理在基于空间的纹理(ISO / IEC TS 24790)方法与基于等效频率的方法之间建立联系。我们的实验结果表明,基于空间和基于频率的方法之间的r2相关性接近0.99。

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