Operando X-Ray Diffraction for Characterization of Photovoltaic Materials

摘要

Understanding the structure-function relationship in photovoltaic materials is a key aspect in the optimization of new materials. Traditional characterization techniques often rely on measuring samples before and after synthesis or operation and then the subsequent comparison of these end points. Here we describe a methodology for X-ray diffraction of operational solar cell devices. In this work, we present, as an example, data investigating the structural tetragonal-to-cubic phase transition in CH