Method and apparatus for characterization by X-ray diffraction of a material with amorphous phase.

摘要

Process for the qualitative and quantitative characterization of a material (2) containing at least one amorphous portion by analysis of the diffraction X-ray in which a combined diffraction pattern of the material and of a crystalline "pattern" is discussed Rietveld method in a computerized, device characterized in that the combined diffraction pattern (11) is obtained by linear mathematical combination of a measured diffraction pattern (8) Crystal "pattern" (1) with a measured diffraction pattern ( 10) the material (2).