Magnetic characterization of on-chip integrated layer of substituted Sr-M hexaferrite beyond 10 GHz

摘要

This paper reports the measurement of ferromagnetic resonance frequency of a thin layered structure of hexagonal ferrite, SrCoTiFeO. XRD, SEM, TEM, and EDAX are used for composition and microstructure characterization. Room-temperature VSM measurements are also performed to determine the magnetic hysteresis. A prominent microwave absorption peak is observed at 12.6 GHz without the presence of any external field and thus can be considered as the ferromagnetic resonance frequency.