首页> 外文会议>IEEE International Conference on Mechatronics and Automation; 20060625-28; Luouang(CN) >Performance Improvement of the LM Device for Measuring Motion Accuracy of Machining Centers
【24h】

Performance Improvement of the LM Device for Measuring Motion Accuracy of Machining Centers

机译:用于加工中心运动精度测量的LM设备的性能改进

获取原文
获取原文并翻译 | 示例

摘要

This paper describes the authors' recent work which includes: (1) Performing some improvements to make the LM device developed previously applicable to precisely assessing small size motion trajectories of machining center located on different motion planes; (2) Applying the improved device on a machining center to detect circular and linear motion trajectories within a small area, and discussing the influence of the movement size and feed rate on the motion accuracy for the tested machining center.
机译:本文介绍了作者最近的工作,其中包括:(1)进行一些改进,使以前开发的LM设备适用于精确评估位于不同运动平面上的加工中心的小尺寸运动轨迹; (2)将改进的装置应用于加工中心,以检测小区域内的圆周和直线运动轨迹,并讨论运动尺寸和进给速度对被测加工中心运动精度的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号