A Novel Fault Self-Detectable Universal Quantum Reversible Circuits Array Design

摘要

Many classic logic gates are irreversible, such as 'And gate', or 'Or gate'. This irreversibility of the calculation results in energy consumption. Reversible circuit technology, like quantum circuits, in which the entire calculation process does not consume energy, can be used for low-power microchip and quantum communication applications. Most technologies focus on the synthesis of reversible circuits, rarely on fault testing. Fault testing is certainly an important step in any powerful implementation. In this paper, we design two reversible quantum units that each one can be used as testing circuit for another. The proposed design for fault self-detection is based on two facts. The complex quantum circuit can be achieved by combining the universal quantum units in parallel or cascade. The quantum circuit is naturally reversible. As a result, a novel universal quantum unit pair for fault self-detection is designed. The proposed structure does not need any extra DFT testing circuit; therefore, the testing cost has been reduced. Besides, even the scale of the circuit increases, the testing complexity stays in O(√n). Thus, our proposed design is efficient for a large scale quantum circuit.