Study on the combination of confocal scanning microscopy and defocusing imaging

摘要

The combination of the confocal scanning microscopy and the defocusing imaging in the plane of imaging system was proposed. A switch lens and a pinhole with fine focusing aid are used to switch between the confocal scanning imaging mode and defocusing imaging mode. Objectives of different magnification can be used to get different field of vision. The complementary images can offer more information than any single one. Image blur or distortion caused by scanning, such as the displacement of the target and the excursion of scanning stage, can be corrected according to the comparison of two images. Location and adjustment of the target can be achieved easily and the accuracy of scanning image will be improved obviously. Some samples were tested on a home-built system.