首页> 外文会议>Hungarian Conference on Materials Science, Testing and Informatics; 20031012-14; Balatonfured(HU) >Application of WFS for simultaneous work function and secondary electron emission measurement on Ba covered tungsten
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Application of WFS for simultaneous work function and secondary electron emission measurement on Ba covered tungsten

机译:WFS在钡包覆钨同时功函数和二次电子发射测量中的应用

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摘要

In the present paper the secondary emission and work function of W covered with different thickness Ba layers are compared. The secondary emission and work function were measured by Work Function Spectroscopy (WFS). It is clearly pointed out that the thin Ba coating causes the the enhancement of electron induced secondary electron emission. In high pressure discharge lamps high secondary emission and high thermionic current are required for reliable operating conditions, i.e., for reaching the nominal burning voltage and current etc. The results prove that the Ba spreading on the W surface from an alkali earth tungstate material is advantageous for lowering the work function and, simultaneously, for increasing the secondary emission yield.
机译:本文比较了不同厚度Ba层覆盖的W的二次发射和功函数。二次发射和功函数通过功函数光谱法(WFS)进行测量。清楚地指出,薄的Ba涂层引起电子诱导的二次电子发射的增强。在高压放电灯中,为了可靠的工作条件,即达到标称的燃烧电压和电流等,需要高的二次发射和高的热电子电流。结果证明,从碱土金属钨酸盐材料在W表面扩散的Ba是有利的。降低功函数,同时提高二次排放量。

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