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Study of ion migration in insulator subjected to DC voltages

机译:直流电压下绝缘子中离子迁移的研究

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Ion migration test suggested in IEC 1325. 1995 forrnHVDC insulators takes into consideration the totalrncharge that would have passed through the volume ofrninsulator in its estimated life of 50 years. This isrnallowed to pass through the insulator in anrnaccelerated manner within few thousands of hours orrnso. Ion migration tests were carried out on fewrnbatches of HVDC insulators. The expected chargernQ50 and number of days for the test was evaluated asrnper IEC-1325, 1995. The ready reckoner of productrnof Q50 and R90 v/s temperature coefficient A wasrnevaluated which can be used to evaluate Q50rnexpeditiously. Though the insulators have higherrnvalues of resistance and better slopes, the testrnduration is higher. The insulators having lowerrnvalues of resistance and lower values of slopes havernless number of test days.
机译:IEC 1325. 1995中建议的HVDC绝缘子的离子迁移测试考虑了在其50年的估计寿命中通过绝缘子体积的总电荷。不允许其在数千小时内以加速的方式穿过绝缘子。离子迁移测试是在几批HVDC绝缘子上进行的。根据IEC-1325,1995年评估了预期的充电器nQ50和测试天数。重新评估了产品Q50和R90 v / s温度系数A的现成推算器,可将其用于快速评估Q50n。尽管绝缘子具有更高的电阻值和更好的斜率,但测试时间却更高。具有较低电阻值和较低斜率值的绝缘子的测试天数很少。

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