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Hydrostatic pressure - a unique tool in studies of quantum structures and light emitting devices based on group-Ⅲ nitrides

机译:静水压-研究基于Ⅲ族氮化物的量子结构和发光器件的独特工具

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In nitride heterostructures and devices, effects related to (ⅰ) polarization induced electric fields (PIEFs) and (ⅱ) spatial segregation of indium leading to exciton/carrier localization are of major significance. However, separate investigation of these effects is not straightforward since they give rise to identical observations, such as a Stokes shift of the luminescence with respect to absorption and a blue shift of luminescence with increasing pump intensity. In this work, we review the usefulness of measurements of the hydrostatic pressure dependence of InGaN luminescence for the verification of the presence of PIEFs in quantum structures and light emitting devices. Additionally, we show that the pressure coefficient is not or only slightly sensitive to the degree of localization in the InGaN alloy. Thus, the variation of the luminescence pressure coefficient in different quantum structures can be almost entirely assigned to changes in the magnitude of internal electric field. Using this knowledge, we demonstrate how the degree of PIEF screening in InGaN based LDs can be evaluated.
机译:在氮化物异质结构和器件中,与(ⅰ)极化感应电场(PIEFs)和(ⅱ)铟的空间隔离导致激子/载流子局部化有关的影响具有重要意义。然而,对这些效应的单独研究并不是直接的,因为它们会产生相同的观察结果,例如发光相对于吸收的斯托克斯位移以及随着泵浦强度增加而产生的蓝光漂移。在这项工作中,我们回顾了测量InGaN发光的静水压力依赖性的有用性,以验证PIEF在量子结构和发光器件中的存在。此外,我们表明压力系数对InGaN合金中的局域化程度不敏感或仅敏感。因此,可以将不同量子结构中的发光压力系数的变化几乎全部分配给内部电场的大小的变化。利用这些知识,我们演示了如何评估基于InGaN的LD中PIEF筛选的程度。

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