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Nitride-based light emitting diode and photodetector dual function devices with InGaN/GaN multiple quantum well structures

机译:具有InGaN / GaN多量子阱结构的基于氮化物的发光二极管和光电探测器双功能器件

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摘要

In this paper, a InGaN/GaN multiple quantum well structure commonly used for light emitting diodes has been employed for dual functions of optoelectronics devices exhibiting photodetector properties in reverse bias, while at the same time preserving the distinct identities of LED in forward bias. The turn on voltage in forward bias and the breakdown voltage in reverse bias were about 3.2 V and -30 V, respectively. The higher photo- and dark-current densities were detected for larger size of devices. The contrast ratio calculated between photo- and dark-current densities of large-size device decreases more rapidly as compared to that of a small-size device. Thus, one can easily integrate photodetectors with LEDs using the same epi-structure to realize a GaN-based optoelectronic integrated circuit (OEIC).
机译:在本文中,通常将用于发光二极管的InGaN / GaN多量子阱结构用于具有反向偏压显示光检测器特性的光电子器件的双重功能,同时保留正向偏压中LED的不同标识。正向偏置的导通电压和反向偏置的击穿电压分别约为3.2 V和-30V。对于较大尺寸的器件,检测到较高的光电流和暗电流密度。与小型设备相比,大型设备的光电流和暗电流密度之间计算出的对比度下降得更快。因此,可以使用相同的外延结构轻松地将光电探测器与LED集成在一起,以实现基于GaN的光电集成电路(OEIC)。

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