Abstract: per describes various reliability and accelerated aging tests that have been performed on LiNbO$-3$/ integrated optical FOG circuits fabricated by annealed proton exchange (APE). Fully packaged devices have been temperature cycled 100 times from $MIN@65 to 125$DGR@C and subjected to 11 Grms random vibration with less than 0.5 dB variation in insertion loss. Potential failure mechanisms of LiNbO$-3$/ integrated optical circuits are discussed. Ten devices with passive 3-dB couplers have been aged at 150$DGR@C and tested every 1000 hours with little, if any, change in device performance.!0
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