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Application of Direct Current Potential Drop for the J-Integral vs. Crack Growth Resistance Curve Characterization

机译:直流电势降在J积分与裂纹增长电阻曲线表征中的应用

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The dc potential drop (DCPD) technique has been applied to derive the J-integral versus crack growth resistance curve (J-R curve) for fracture toughness characterization of structural materials. The test matrix covered three materials including type 316LN stainless steels, Ni-based alloy 617, and one ferritic-martensitic steel, three specimen configurations including standard compact, single edge bend, and disk-shaped compact specimens, and temperatures ranging from 20 to 650℃. When compared with baseline J-R curves derived from the ASTM E1820-13 normalization method, the original J-R curves from the DCPD technique yielded much smaller J_Q values due to the influence of crack blunting, plastic deformation, etc., on potential drop. To compensate these effects, a new procedure for adjusting DCPD J-R curves was proposed. After applying the new adjustment procedure, the average difference in J_Q between the DCPD technique and the normalization method was only 5.2 % and the difference in tearing modulus was 7.4 %. These promising results demonstrate the applicability of the DCPD technique for J-R curve characterization especially in extreme environments, such as elevated temperatures, where the conventional elastic unloading compliance method faces considerable challenges.
机译:直流电势降(DCPD)技术已应用于推导J积分对裂纹增长阻力曲线(J-R曲线),用于表征结构材料的断裂韧性。测试矩阵覆盖了三种材料,包括316LN型不锈钢,镍基合金617和一种铁素体-马氏体钢,包括标准压块,单边弯曲和盘形压块样本在内的三种样本配置,温度范围为20至650 ℃。与ASTM E1820-13规范化方法得出的基线J-R曲线相比,由于裂纹钝化,塑性变形等对电势下降的影响,DCPD技术产生的原始J-R曲线产生的J_Q值小得多。为了补偿这些影响,提出了一种调整DCPD J-R曲线的新方法。应用新的调整程序后,DCPD技术和归一化方法之间的J_Q平均差异仅为5.2%,撕裂模量差异为7.4%。这些有希望的结果证明了DCPD技术在J-R曲线表征中的适用性,特别是在极端环境(例如高温)下,传统的弹性卸载柔度方法面临着巨大的挑战。

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