The use of dynamic probes to study the drying and crystallization in P3HT:PCBM thin films

摘要

A combination of spectroscopic ellipsometry (SE) and grazing incidence x-ray scattering (GI-XS) are used to probe structure formation in thin films of an organic semiconductor blend in-situ during the film casting process. This information is vital for designing future processing routes which exploit the favourable properties of these materials.