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Application of EBG Structures at Sub-Array Level

机译:EBG结构在子阵列级的应用

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Low efficiency and pattern degradation are specific problems encountered in phased-array designs based on integrated technology, as for example used in low-profile radar applications. These problems are largely due to the excitation of surface waves (SW). It was demonstrated in earlier work that Electromagnetic Band Gap (EBG) technology can decrease or even eliminate SWs. However, for the most effective application, the EBG should preferably fully enclose the individual elements that compose the array. This inherently creates a problem of spacing, in the sense that scanning becomes more limited or virtually impossible. A solution to the problem could be found in the application of the EBG at sub-array level. In this contribution we investigate the effect of this concept in terms of directivity, radiation-pattern purity and scattering parameters. Commercial software was used to study various sub-array concepts with the application of EBGs to limit SWs. Two hardware demonstrator array panels were produced and experimentally tested for validation purposes.
机译:低效率和模式退化是基于集成技术的相控阵设计中遇到的特定问题,例如用于低调雷达应用中。这些问题主要归因于表面波(SW)的激发。较早的工作证明,电磁带隙(EBG)技术可以减少甚至消除开关。然而,对于最有效的应用,EBG最好应完全包围构成阵列的各个元件。在扫描变得更加受限或实际上不可能的意义上,这固有地产生了间隔问题。该问题的解决方案可以在子阵列级别的EBG应用中找到。在这项贡献中,我们从方向性,辐射图纯度和散射参数方面研究了此概念的效果。使用商业软件来研究各种子阵列概念,并应用EBG限制软件。生产了两个硬件演示器阵列面板,并进行了测试以进行验证。

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