High precision facula locating tehcniuqe for laser-CCD microstrain measurement

摘要

The microstrain meter,which uses a semiconductor laer as the light source and uses a CCD camera as the facula position sensitive evice,is presented in this paper.Since the refletion measuremnt techiiqe is adopted,the facula figure will be in an elliptical shape,and the center of the facula is different form the power distribution center.In orde to increase the cmeasureing accuracy,the matters that can affect the measuring accuracy are analyzed,and the corresponding means to eliminate the drawbacks are discussed in htis paper Eventually,the measureing accuracy of the laser-CCE microstrain meter is imporved significantly.