Invertebrate infestation of bulk storage grain can initiate spoilage processes detrimental to post-harvest quality. An analytical device capable of effective early detection of such infestation would therefore prove invaluable to the grain industry. Results from the application of electronic nose technology to detection of invertebrate contaminants in grain are presented. Using a metal oxide semiconductor sensor array, detection of mite infestation in wheat grain was clearly visible at run-time, with 90% to 95% classification accuracy achieved with laboratory test samples.
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