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Advances in WLCSP Technologies to Enable Cost-Reduction

机译:WLCSP技术的进步可以降低成本

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Over the past few years, Wafer Level Chip Size Packages (WLCSPs) have gained widespreadrnadoption, due to their ability to deliver higher performance at lower or equivalent costs when compared torncompeting packages. WLCSPs have been an excellent fit for the handheld/portable industry, where thernstrong push for cost-reduction and miniaturization, coupled with relatively relaxed reliabilityrnrequirements, have motivated true chip-sized packages requiring no underfill or overmold. Reliabilityrnperformance initially limited the application of WLCSPs to small die sizes (<2.5mm), low pin countsrn(<25) and mature silicon technology nodes. Also, to date, a majority of WLCSPs have been built at arn0.5mm bump pitch, although there is increasing growth in the use of WLCSPs at 0.4mm pitch. Thesernfactors have allowed WLCSP packaging to flourish in the mixed signal and analog market space. Withrnthe maturity in this market segment, the WLCSP is beginning to transition from an advanced package to arncommodity package and is subject to the price-pressure that accompanies this transition.rnMore recently, the semiconductor industry has seen advances in WLCSP technology which have enabledrnthe qualification envelope to be expanded to products with pin counts > 120. These advances havernfacilitated the use of WLCSPs for other component types such as RF, high speed, broadband and memory,rnmany of which require advanced silicon technology nodes as well. Consequently, WLCSP is expandingrnto markets and applications previously supported by QFN and flip chip CSP. This expansion putsrnadditional price and cycle time pressure on WLCSP manufacturing. The cycle time pressure is furtherrnenhanced by the changing business models and supply chain strategies adopted by companies in the newrneconomic environment. To meet these growing market demands, WLCSP providers are faced with thernchallenges of providing faster cycle times and higher capacity without significant increases in capitalrnexpenditure.rnThe above factors have driven the need for new WLCSP technologies that utilize fewer process stepsrncompared to common WLCSP product offerings, while maintaining the robustness necessary for meetingrnquality and reliability requirements. Amkor is developing multiple WLCSP technology platforms to caterrnto the cost and performance requirements of the diverse application space.rnThis paper will provide examples that significantly reduce overall package cost by removingrnphotolithography layers. Each photomask layer removed saves in material costs, capital depreciationrncosts, overhead, and process cycle time. Materials, package size, and internal qualification vehicles arerncarefully chosen as part of Amkor’s product introduction for the proposed process flows. This paper willrnexamine material options, i.e., polymers and solder alloys, for these new structures and will also examinernthe effects of die sizes and I/O counts on product reliability. Detailed analyses of the failure modesrnproduced during reliability testing will be coupled with mechanical simulations to enhance understandingrnof the failure mechanisms and to further strategies for improving product reliability.
机译:在过去的几年中,晶圆级芯片尺寸封装(WLCSP)获得了广泛的采用,这是因为与竞争封装相比,它们能够以更低或相当的成本提供更高的性能。 WLCSP非常适合手持/便携式行业,在这些领域中,为降低成本和实现小型化的强劲推动,以及相对宽松的可靠性要求,促使了真正的芯片尺寸封装,不需要底部填充或包覆成型。可靠性性能最初将WLCSP的应用限制在小芯片尺寸(<2.5mm),低引脚数(<25)和成熟的硅技术节点上。同样,迄今为止,大多数WLCSP都以arn0.5mm的凸点间距制造,尽管以0.4mm间距的WLCSP的使用正在增长。这些因素使WLCSP封装在混合信号和模拟市场领域蓬勃发展。随着这一细分市场的成熟,WLCSP正在开始从高级封装过渡到学习商品封装,并且受到这种转换所伴随的价格压力的影响。最近,半导体行业看到了WLCSP技术的进步,这使得资格认证信封成为可能。可以扩展到引脚数> 120的产品。这些进步促进了WLCSP用于其他组件类型的使用,例如RF,高速,宽带和内存,其中许多组件也需要先进的硅技术节点。因此,WLCSP正在向先前由QFN和倒装芯片CSP支持的市场和应用扩展。这种扩展给WLCSP制造带来了额外的价格和周期时间压力。在新的经济环境中,公司采用不断变化的业务模式和供应链战略,进一步加剧了周期时间压力。为了满足这些不断增长的市场需求,WLCSP提供商面临着以下挑战:提供更快的周期时间和更高的容量而又不显着增加资本支出。上述因素促使人们需要使用与常规WLCSP产品相比更少的工艺步骤的新型WLCSP技术。保持满足质量和可靠性要求所需的坚固性。 Amkor正在开发多个WLCSP技术平台,以满足不同应用空间的成本和性能要求。本文将提供一些示例,这些示例可通过去除光刻层显着降低总体封装成本。去除的每个光掩模层节省了材料成本,资本折旧成本,开销和工艺周期时间。在拟议的工艺流程中,材料,包装尺寸和内部认证工具都经过精心挑选,作为Amkor产品介绍的一部分。本文将研究这些新结构的材料选择,即聚合物和焊料合金,还将研究管芯尺寸和I / O数量对产品可靠性的影响。对可靠性测试过程中产生的故障模式的详细分析将与机械仿真相结合,以增强对故障机理的理解,并进一步提高产品可靠性。

著录项

  • 来源
    《Device packaging 2010》|2010年|p.1|共1页
  • 会议地点 Scottsdale/Fountain Hills AZ(US)
  • 作者单位

    Amkor Technology Inc.rn3021 Cornwallis Rd.rnRTP, NC 27709rnP: 919-248-9230rnE: rex.anderson@amkor.com;

    Amkor Technology Inc.rn3021 Cornwallis Rd.rnRTP, NC 27709;

    Amkor Technology Inc.rn3021 Cornwallis Rd.rnRTP, NC 27709;

    Amkor Technology Inc.rn3021 Cornwallis Rd.rnRTP, NC 27709;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 制造工艺;
  • 关键词

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