An extension of Cohn's sensitivity theorem to mismatch analysis of 1-port resistor networks

摘要

An analytical expression of statistical mismatch properties of 1-port resistor networks and associated figure-of-merit is proposed, and related to Cohn's sensitivity theorem. This expression is then used to demonstrate matching properties of R-ladders. Experimental verification of this formula is done by comparing theoretical results to Monte-Carlo simulations of random R-networks up to 10 resistors, which are generated by a new graph-based algorithm. Further analysis is performed on this figure-of-merit for all generated networks, leading to more insights into matching properties of R-networks.